Our Eden instruments products
In Situ Equipments
Alemnis
ConnectomX | Ultramicrotome KATANA
DELMIC | CL | FAST-EM | Integrated SEM
Evactron – Remote Plasma Cleaning Devices
IMINA Technologies – In situ SEM Nanoprobing
Kammrath & Weiss – Tensile stage and temperature stage
NENOVISION | Scanning Probe Microscope
POINT ELECTRONIC – Supplier of electronic components and software solutions for electron microscopy
In Operando Equipments
Fischione | Sample preparation
Mel-build
Protochips | In Situ, In Operando EM Microscopy
VitroTEM – Graphene liquid cells at a click
Ex Situ equipments
ELMO
Fischione Instruments
MEIWAFOSIS
RMC | EM Sample Prep solutions
SEMPLOR – Tabletop SEM
Microanalyse
SAMx Plus | EDS system
Nano Optics Berlin | WDSX-300
Direct Electron Detector
CheeTah
MerlinEM
Merlin T4
Hybrid camera with single detection of ions, photons, and electrons
Our semiconductors products
Frontend equipment
UNITEMP
LOGITECH
Test
IMINA Technologies – In situ SEM Nanoprobing – tests
miBot – test
Nanoprobing SEM Solution Package – tests
Delayering
Fischione chipmill 1064
SEM Mill – Model 1061 – destratification
NENOVISION | Scanning Probe Microscope – destratification
News
Contact
English
Français
(
French
)
Test
"
IMINA Technologies
In Situ SEM Nanoprobing
learn more
