
Alemnis
Nanomechanical test solutions

CONNECTOMX
Compact In-Situ SEM/Serial Block-Face ultramicrotomy system

DELMIC
Integrated SEM and fluorescence microscope
Cathodoluminescence detection system

EVACTRON®
Remote Plasma Cleaning Devices

IMINA Technologies
In Situ SEM Nanoprobing

Kammrath & Weiss
Tensile stage and temperature stage

NENOVISION
Scanning Probe Microscope

POINT ELECTRONIC
Components and software for electron microscopy