Upgrade your SEM

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Complete electronics and software upgrades for all SEM types.

5 good reasons to restore your SEM

01 – Increased performance

  • High-resolution image acquisition is required, beyond the ability of the original SEM electronics.
  • Simultaneous acquisition is needed for SE, BSE, CL, STEM, however SEM is restricted to one signal per scan
  • New auto functions, including Focus, Brightness and Contrast, Stage, Gun, Vacuum, etc.

02 – Network compatibility

  • Network connectivity is required for shared storage but SEM PC is outdated and no longer compatible/allowed.
  • SEM screen must be viewed/shared remotely, however SEM software does not allow video capture.
  • New installation requires that the SEM must be operated remotely because of space or safety restrictions.

03 – New techniques

  • High-quality image acquisition is needed for complex illumination and colour composition.
  • New analysis requires new detectors, such as SE, BSE, EBIC, EBAC, RCI or EDS.
  • New degrees of automation are needed for large area mapping, video acquisition or surface topography.

04 – High-value attachment or workflow

  • Cost of relocating or reacquiring the analytical equipment is prohibitive compared with the cost of upgrading the SEM.
  • Established/certified analytical workflows must be maintained beyond the OEM service.
  • Operator training and support needs to be standardised for all SEM types.

05 – Acquisition and service costs

  • Extending the lifetime of existing SEM is more cost effective than acquisition of a new microscope.
  • SEM return is maximised after the upgrade, as downtime is minimised.
  • SEM service cost is reduced after the upgrade.

MEB upgrades follow 3 steps

ETAPE 01
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ETAPE 01

1st stage: the acquisition upgrade

  • Microsoft Windows 10 or less, with network compatibility.
  • Simultaneous signal acquisition for SE, BSE, EDS, WDS, etc.
  • Optional PC and display(s) or laptop.
ETAPE 02
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ETAPE 02

2nd stage: the controls upgrade

  • New SEM control electronics and software.
  • Complete electronics for the SEM column.
  • Automatic vacuum, gun, stage, detector controls.
  • New manual control panels and accessories.
ETAPE 03
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ETAPE 03

3rd the techniques upgrade

  • Atomic-number discrimination with BSE detectors.
  • Topography measurements with shape-from-shadow.
  • Micro-analysis with EDS detectors and mapping.
  • Electrical failure analysis with EBIC and EBAC/RCI.

Upgrade path

Optional control panels for increased speed and productivity

  • SEM panel with magnification, focus, image shift, brightness, contrast, stigmatism.
  • Stage panel with trackball/joystick, XYZR locks and store/recall functions.
  • USB2 controlled and fully integrated with the microscope controls software.

Optional stage controller for automatic positioning and rotation

  • Integrated click-and-move, rotation and large area map acquisition.
  • Configurable software limits for collision avoidance.
  • USB2 controlled and fully integrated with the micro-scope controls software.

Optional SE, BSE and EDS detectors for new techniques/applications

  • High performance SE detector electronics.
  • Standard and low-kV BSE detector and electronics.
  • Practical and affordable EDS for SEM and STEM.

Optional video processor for extended imaging channels

  • Channel independent controls for brightness and contrast.
  • Hardware mixed output for simultaneous acquisition with SE, CL or EDS.
  • USB2 controlled and fully integrated with the acquisition software.

Optional IR chamberscope for added flexibility and safety

  • In situ mount for optimum orientation and view angle.
  • PC display or standalone monitor.
  • USB2 controlled and fully integrated with the microscope controls software.

Optional microscope monitor for events logging and preventive maintenance

  • Automatic acquisition and compression of microscope operation parameters.
  • 16 x 16-bit analogue signal inputs, and software API for software parameters and events.
  • Live and offline viewer with PDF export.