Merlin T4 is a next-generation hybrid pixel direct  electron detector, designed to capture what others  miss. Combining frame- and event-based readout,  it brings new levels of speed, timing precision, and dynamic range to STEM, TEM, and ultrafast workflows.

Timepix4 ASIC, developed by CERN and the Medipix4  collaboration, integrates the best of Timepix3 and  Medipix3 into a powerful, single-chip solution.

Description
Z Z
Specifications

Unlocking the Next Generation of Electron Microscopy

Merlin T4 is a revolutionary hybrid pixel detector for Transmission  Powered by CERN’s Timepix4 ASIC, the most advanced pixel chip  available to the TEM community, Merlin T4 delivers 200 ps time  resolution, >40,000 fps frame rates, and event-based acquisition that  transcends traditional frame limitations. Electron Microscopy (TEM), purpose-built for beam-sensitive, ultrafast,  and data-intensive applications such as 4D-STEM, Ptychography, and  MicroED.

Engineered for Modern Research Challenges

From dynamic phase transitions to domain wall motion, mechanical  deformation, and bandgap switching, Merlin T4 enables researchers to  capture ultrafast material behaviours across disciplines—from materials  science and semiconductors to pharmaceuticals and energy.

Its large active area, gapless readout, and dual-mode architecture (event+ frame) make it the detector of choice for labs demanding both  sensitivity and speed. Merlin T4 can detect even the most subtle electron  signals with exceptional clarity—without compromising on throughput,  reliability, or seamless integration into advanced microscopy workflows.

Key features

  • Outperforms Medipix3 by 20× in frame rate and 15× in flux

Enables native scan speeds even under intense  flux conditions, with zero dead time andfull-frame capture.

  • Unmatched Temporal and Event Performance

With 14.5× higher event handling capacity and 8×  finer time resolution than a single-chip Timepix3-  based detector, Merlin T4 sets a new standard for  ultrafast 4D-STEM and low-dose imaging.

  • High-Speed Scanning Reduces Drift

Shorter dwell times minimise drift and beam damage, critical for beam-sensitive samples.

  • Event-Based Detection:

In event-driven mode, Merlin T4 outputs a  stream of data packets—each representing an  individual electron event. Every packet includes  pixel coordinates, Time-of-Arrival (ToA), and  Time-over-Threshold (ToT), enabling precise  temporal and energy-related measurements  with nanosecond-scale accuracy.

  • Gapless Readout with Dual-Counter Pixels 

Merlin T4 records every incoming event with zero loss, ensuring continuous acquisition for time-resolved or tilt-series data.

  • Large Active Area (694.4 mm²)

Delivers expansive field-of-view coverage on a  single-chip sensor—offering seamless imaging  without inter-chip gaps. Ideal for high-  throughput imaging, mapping workflows, and  capturing large-scale structures with  uncompromised spatial integrity.

 

Key application

  • 4D STEM / Ultra-Fast 4D STEM
  • 3D ED/ MicroED
  • Ptychography & Phase Imaging
  • Strain Mapping & Electric Field Analysis
  • Lorentz Microscopy
  • Dynamic TEM imaging
  • In-situ characterisation
  • Cryo-STEM & Low-Dose Imaging

Technical specifications 

 

Resolution:

512 x 448, 55 μm pitch

Active area:

694.4 mm2

Event mode:

Time over threshold and time of arrival

Readout bandwidth:

~81Gbps

Time of arrival resolution:

195 ps

Count rate (event mode):

>70 pA current at 200keV

Frame mode:

Continuous Read Write (gapless)

Maximum frame rates:

40 kfps (8-bit)

Mount:

Compact, retractable, interlocked. Fits most microscopes.