Merlin T4 is a next-generation hybrid pixel direct electron detector, designed to capture what others miss. Combining frame- and event-based readout, it brings new levels of speed, timing precision, and dynamic range to STEM, TEM, and ultrafast workflows.
Timepix4 ASIC, developed by CERN and the Medipix4 collaboration, integrates the best of Timepix3 and Medipix3 into a powerful, single-chip solution.

Unlocking the Next Generation of Electron Microscopy
Merlin T4 is a revolutionary hybrid pixel detector for Transmission Powered by CERN’s Timepix4 ASIC, the most advanced pixel chip available to the TEM community, Merlin T4 delivers 200 ps time resolution, >40,000 fps frame rates, and event-based acquisition that transcends traditional frame limitations. Electron Microscopy (TEM), purpose-built for beam-sensitive, ultrafast, and data-intensive applications such as 4D-STEM, Ptychography, and MicroED.
Engineered for Modern Research Challenges
From dynamic phase transitions to domain wall motion, mechanical deformation, and bandgap switching, Merlin T4 enables researchers to capture ultrafast material behaviours across disciplines—from materials science and semiconductors to pharmaceuticals and energy.
Its large active area, gapless readout, and dual-mode architecture (event+ frame) make it the detector of choice for labs demanding both sensitivity and speed. Merlin T4 can detect even the most subtle electron signals with exceptional clarity—without compromising on throughput, reliability, or seamless integration into advanced microscopy workflows.
Key features
- Outperforms Medipix3 by 20× in frame rate and 15× in flux
Enables native scan speeds even under intense flux conditions, with zero dead time andfull-frame capture.
- Unmatched Temporal and Event Performance
With 14.5× higher event handling capacity and 8× finer time resolution than a single-chip Timepix3- based detector, Merlin T4 sets a new standard for ultrafast 4D-STEM and low-dose imaging.
- High-Speed Scanning Reduces Drift
Shorter dwell times minimise drift and beam damage, critical for beam-sensitive samples.
- Event-Based Detection:
In event-driven mode, Merlin T4 outputs a stream of data packets—each representing an individual electron event. Every packet includes pixel coordinates, Time-of-Arrival (ToA), and Time-over-Threshold (ToT), enabling precise temporal and energy-related measurements with nanosecond-scale accuracy.
- Gapless Readout with Dual-Counter Pixels
Merlin T4 records every incoming event with zero loss, ensuring continuous acquisition for time-resolved or tilt-series data.
- Large Active Area (694.4 mm²)
Delivers expansive field-of-view coverage on a single-chip sensor—offering seamless imaging without inter-chip gaps. Ideal for high- throughput imaging, mapping workflows, and capturing large-scale structures with uncompromised spatial integrity.
Key application
- 4D STEM / Ultra-Fast 4D STEM
- 3D ED/ MicroED
- Ptychography & Phase Imaging
- Strain Mapping & Electric Field Analysis
- Lorentz Microscopy
- Dynamic TEM imaging
- In-situ characterisation
- Cryo-STEM & Low-Dose Imaging
Technical specifications
Resolution: |
512 x 448, 55 μm pitch |
Active area: |
694.4 mm2 |
Event mode: |
Time over threshold and time of arrival |
Readout bandwidth: |
~81Gbps |
Time of arrival resolution: |
195 ps |
Count rate (event mode): |
>70 pA current at 200keV |
Frame mode: |
Continuous Read Write (gapless) |
Maximum frame rates: |
40 kfps (8-bit) |
Mount: |
Compact, retractable, interlocked. Fits most microscopes. |