{"id":25982554,"date":"2024-04-29T21:39:41","date_gmt":"2024-04-29T19:39:41","guid":{"rendered":"https:\/\/eden-instruments.com\/ex-situ-equipments\/fischione-instruments-ex-situ\/systeme-de-preparation-dechantillons-picomill-tem-modele-1080\/"},"modified":"2024-06-08T12:58:44","modified_gmt":"2024-06-08T10:58:44","slug":"picomill-tem-specimen-preparation-system-model-1080","status":"publish","type":"page","link":"https:\/\/eden-instruments.com\/en\/ex-situ-equipments\/fischione-instruments-ex-situ\/picomill-tem-specimen-preparation-system-model-1080\/","title":{"rendered":"PicoMill TEM specimen preparation system \u2013 Model 1080"},"content":{"rendered":"<p>[et_pb_section fb_built=&#8221;1&#8243; _builder_version=&#8221;4.24.3&#8243; _module_preset=&#8221;default&#8221; width=&#8221;100%&#8221; custom_margin=&#8221;0px||0px||false|false&#8221; custom_padding=&#8221;0px||0px||false|false&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_row _builder_version=&#8221;4.25.0&#8243; _module_preset=&#8221;default&#8221; width=&#8221;100%&#8221; max_width=&#8221;100%&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.25.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.25.1&#8243; _module_preset=&#8221;default&#8221; header_3_text_align=&#8221;left&#8221; header_3_font_size=&#8221;38px&#8221; header_3_line_height=&#8221;1.2em&#8221; max_width_tablet=&#8221;35rem&#8221; max_width_phone=&#8221;35rem&#8221; max_width_last_edited=&#8221;off|desktop&#8221; custom_margin=&#8221;0px||9px||false|false&#8221; header_3_font_size_tablet=&#8221;32px&#8221; header_3_font_size_phone=&#8221;26px&#8221; header_3_font_size_last_edited=&#8221;on|phone&#8221; locked=&#8221;off&#8221; global_colors_info=&#8221;{}&#8221;]<\/p>\n<h3>Combines an ultra-low energy, inert gas ion source, and a scanning electron column with multiple detectors to yield optimal TEM specimens<span style=\"color: #ee0d08;\">.<\/span><\/h3>\n<p>[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=&#8221;3_5,2_5&#8243; 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_module_preset=&#8221;default&#8221; locked=&#8221;off&#8221; global_colors_info=&#8221;{}&#8221;]<\/p>\n<ul>\n<li>Achieve ultimate specimen quality \u2013 free from amorphous and implanted layers<\/li>\n<li>Complements FIB technology<\/li>\n<li>Milling without introduction of artifacts<\/li>\n<li>Advanced detector technology for imaging and precise endpoint detection<\/li>\n<li>In situ imaging with ions and electrons<\/li>\n<li>Microscope connectivity for risk-free specimen handling<\/li>\n<li>Adds capability and capacity<\/li>\n<li>Fast, reliable, and easy to use<\/li>\n<\/ul>\n<p>[\/et_pb_text][\/et_pb_column][et_pb_column type=&#8221;2_5&#8243; _builder_version=&#8221;4.24.3&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_image src=&#8221;data:image\/svg+xml;base64,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&#8221; 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