[et_pb_section fb_built=”1″ _builder_version=”4.24.3″ _module_preset=”default” width=”100%” custom_margin=”0px||0px||false|false” custom_padding=”0px||0px||false|false” global_colors_info=”{}”][et_pb_row _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.25.0″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_font_size=”38px” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}”]<\/p>\n
[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”3_5,2_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||||false|false” custom_padding=”0px||75px||false|false” locked=”off” global_colors_info=”{}”][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}”][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” locked=”off” global_colors_info=”{}”]For many of today\u2019s advanced materials, transmission electron microscopy (TEM) is the best technique for gathering valuable information about microstructure and properties. [\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”1_3,1_3,1_3″ make_equal=”on” _builder_version=”4.24.3″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”|auto||auto|false|false” locked=”off” global_colors_info=”{}”][et_pb_column type=”1_3″ _builder_version=”4.24.3″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” border_width_all=”1px” border_color_all=”#D72B2F” global_colors_info=”{}”][et_pb_blurb title=”Ultra-low-energy, inert-gas ion source” use_icon=”on” font_icon=”||divi||400″ icon_color=”#D72B2F” image_icon_width=”40px” _builder_version=”4.25.1″ _module_preset=”default” header_level=”h3″ header_font=”Albert Sans|700|||||||” header_text_align=”center” header_text_color=”#7C2022″ body_font=”Inter|300|||||||” body_text_color=”#430C0D” body_font_size=”16px” background_enable_color=”off” custom_padding=”30px|10px|30px|10px|true|true” border_color_all=”#D72B2F” global_colors_info=”{}”][\/et_pb_blurb][\/et_pb_column][et_pb_column 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Quisque velit nisi, pretium ut lacinia in, elementum id enim. Quisque velit nisi, pretium ut lacinia in, elementum id enim.Proin eget tortor risus. Vestibulum ac diam sit amet quam vehicula elementum sed sit amet dui.<\/p>\n [\/dipi_advanced_tabs_item][dipi_advanced_tabs_item title=”Specifications” use_library_content=”on” divi_library=”25980383″ admin_label=”Description” icon_color=”rgba(21,2,42,0.3)” icon_color_active=”#B42124″ tab_media=”icon” font_icon=”Z||divi||400″ font_icon_active=”\uf2bd||fa||400″ tab_icon_placement=”top” tab_icon_placement_phone=”top” _builder_version=”4.25.1″ _module_preset=”default” text_font=”Inter|300|||||||” text_text_align=”center” text_text_color=”#430C0D” text_line_height=”1.9em” header_3_text_color=”#430C0D” header_3_font_size=”28px” custom_margin=”||0px||false|false” global_colors_info=”{}”]<\/p>\n Lorem ipsum dolor sit amet, consectetur adipiscing elit. Quisque velit nisi, pretium ut lacinia in, elementum id enim. Quisque velit nisi, pretium ut lacinia in, elementum id enim.Proin eget tortor risus. Vestibulum ac diam sit amet quam vehicula elementum sed sit amet dui.<\/p>\n [\/dipi_advanced_tabs_item][dipi_advanced_tabs_item title=”Downloads” admin_label=”Sp\u00e9cifications” img_placement=”row” icon_color=”rgba(21,2,42,0.3)” icon_color_active=”#B42124″ tab_media=”icon” font_icon=”\uf1c1||fa||400″ font_icon_active=”g||divi||400″ tab_icon_placement=”top” _builder_version=”4.25.1″ _module_preset=”default” text_text_align=”left” text_text_color=”#15022A” text_line_height=”1.9em” custom_margin=”||0px||false|false” hover_enabled=”0″ global_colors_info=”{}” sticky_enabled=”0″]<\/p>\n \n\tMicroelectronic device delayering using an adjustable broad\u2010beam ion source\t(0 downloads\t)\n<\/a>\n The NanoMill system uses an ultra-low energy, concentrated ion beam to produce the highest quality specimens for transmission electron microscopy.For many of today\u2019s advanced materials, transmission electron microscopy (TEM) is the best technique for gathering valuable information about microstructure and properties. Because features in nanotechnology research and semiconductor device specimens continue to decrease in size, […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":25982439,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"on","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"dipi_cpt_category":[],"class_list":["post-25982444","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982444","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/comments?post=25982444"}],"version-history":[{"count":5,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982444\/revisions"}],"predecessor-version":[{"id":25982511,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982444\/revisions\/25982511"}],"up":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982439"}],"wp:attachment":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/media?parent=25982444"}],"wp:term":[{"taxonomy":"dipi_cpt_category","embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/dipi_cpt_category?post=25982444"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
\nBecause features in nanotechnology research and semiconductor device specimens continue to decrease in size, it is essential that specimens be both very thin and free of preparation- induced artifacts. These requirements are even more important when using TEMs with aberration correction and monochromated electron sources where resolution is sub-\u00c5ngstr\u00f6m.[\/et_pb_text][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” text_font_size=”20px” link_line_height=”1.5em” locked=”off” global_colors_info=”{}”]\n\tNanoMill\u00ae TEM Specimen Preparation System - Model 1040\t(1 download\t)\n<\/a>\n[\/et_pb_text][\/et_pb_column][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}”][et_pb_image src=”data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMTA4MCIgaGVpZ2h0PSI1NDAiIHZpZXdCb3g9IjAgMCAxMDgwIDU0MCIgeG1sbnM9Imh0dHA6Ly93d3cudzMub3JnLzIwMDAvc3ZnIj4KICAgIDxnIGZpbGw9Im5vbmUiIGZpbGwtcnVsZT0iZXZlbm9kZCI+CiAgICAgICAgPHBhdGggZmlsbD0iI0VCRUJFQiIgZD0iTTAgMGgxMDgwdjU0MEgweiIvPgogICAgICAgIDxwYXRoIGQ9Ik00NDUuNjQ5IDU0MGgtOTguOTk1TDE0NC42NDkgMzM3Ljk5NSAwIDQ4Mi42NDR2LTk4Ljk5NWwxMTYuMzY1LTExNi4zNjVjMTUuNjItMTUuNjIgNDAuOTQ3LTE1LjYyIDU2LjU2OCAwTDQ0NS42NSA1NDB6IiBmaWxsLW9wYWNpdHk9Ii4xIiBmaWxsPSIjMDAwIiBmaWxsLXJ1bGU9Im5vbnplcm8iLz4KICAgICAgICA8Y2lyY2xlIGZpbGwtb3BhY2l0eT0iLjA1IiBmaWxsPSIjMDAwIiBjeD0iMzMxIiBjeT0iMTQ4IiByPSI3MCIvPgogICAgICAgIDxwYXRoIGQ9Ik0xMDgwIDM3OXYxMTMuMTM3TDcyOC4xNjIgMTQwLjMgMzI4LjQ2MiA1NDBIMjE1LjMyNEw2OTkuODc4IDU1LjQ0NmMxNS42Mi0xNS42MiA0MC45NDgtMTUuNjIgNTYuNTY4IDBMMTA4MCAzNzl6IiBmaWxsLW9wYWNpdHk9Ii4yIiBmaWxsPSIjMDAwIiBmaWxsLXJ1bGU9Im5vbnplcm8iLz4KICAgIDwvZz4KPC9zdmc+Cg==” _builder_version=”4.25.0″ _module_preset=”default” global_colors_info=”{}”][\/et_pb_image][\/et_pb_column][\/et_pb_row][et_pb_row _builder_version=”4.24.3″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px|auto|-2px|auto|false|false” custom_margin_tablet=”0px||75px||false|false” custom_margin_phone=”0px||55px||false|false” custom_margin_last_edited=”on|phone” custom_padding=”0px||0px||false|false” animation_style=”fade” animation_speed_curve=”ease” locked=”off” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.24.2″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_2_font=”Albert Sans|700|||||||” header_2_text_align=”center” header_2_text_color=”#430C0D” header_2_font_size=”38px” header_2_line_height=”1.2em” module_alignment=”center” custom_margin=”0px||30px||false|false” header_2_font_size_tablet=”41px” header_2_font_size_phone=”28px” header_2_font_size_last_edited=”on|phone” global_colors_info=”{}”]<\/p>\nBenefits.<\/span><\/h2>\n
Application notes<\/h3>\n
\n\n\tSpecimen configuration\t(0 downloads\t)\n<\/a>\n
\n\n\tRemoval of amorphous layer from nanoneedle specimens fabricated by focused ion beam\t(0 downloads\t)\n<\/a>\n
\n\n\tIn \u0304uence of foreign-object damage on crack initiation and early crack growth during high-cycle fatigue of Ti\u00b16Al\u00b14V\t(0 downloads\t)\n<\/a>\n
\n\n\tPost-FIB TEM Sample Preparation Using A Low Energy Argon Beam\t(0 downloads\t)\n<\/a>\n
\n\n\tAtomic Scale Structure and Chemical Composition across Order-Disorder Interfaces\t(0 downloads\t)\n<\/a>\n
\n\n\tRaising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM\t(0 downloads\t)\n<\/a>\n
\n\n\tUltrathin specimen preparation by a low-energy Ar-ion milling method\t(0 downloads\t)\n<\/a>\n
\n\n\tSample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view\t(0 downloads\t)\n<\/a>\n
\n\n\tPractical aspects of the use of the X2 holder for HRTEM-quality TEM sample preparation by FIB\t(0 downloads\t)\n<\/a>\n[\/dipi_advanced_tabs_item][\/dipi_advanced_tabs][\/et_pb_column][\/et_pb_row][\/et_pb_section]<\/p>\n","protected":false},"excerpt":{"rendered":"