{"id":25982138,"date":"2024-04-23T21:44:47","date_gmt":"2024-04-23T19:44:47","guid":{"rendered":"https:\/\/eden-instruments.com\/in-situ-equipments\/point-electronic-products-for-your-sem\/ebac-rci\/"},"modified":"2024-05-30T12:23:14","modified_gmt":"2024-05-30T10:23:14","slug":"ebac-rci","status":"publish","type":"page","link":"https:\/\/eden-instruments.com\/en\/in-situ-equipments\/point-electronic-products-for-your-sem\/ebac-rci\/","title":{"rendered":"EBAC-RCI"},"content":{"rendered":"

[et_pb_section fb_built=”1″ _builder_version=”4.25.0″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_row _builder_version=”4.25.0″ _module_preset=”default” width=”90%” max_width=”1170px” custom_margin=”0px||75px||false|false” custom_margin_tablet=”0px||75px||false|false” custom_margin_phone=”0px||55px||false|false” custom_margin_last_edited=”on|phone” custom_padding=”0px||0px||false|false” animation_style=”fade” animation_speed_curve=”ease” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”4_4″ _builder_version=”4.24.2″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_2_font=”Albert Sans|700|||||||” header_2_text_align=”center” header_2_text_color=”#430C0D” header_2_font_size=”38px” header_2_line_height=”1.2em” module_alignment=”center” custom_margin=”0px||30px||false|false” hover_enabled=”0″ header_2_font_size_tablet=”41px” header_2_font_size_phone=”28px” header_2_font_size_last_edited=”on|phone” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

Find exact location of any open, resistive or shorting defect.<\/span><\/h2>\n

[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”2_5,3_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||80px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_image src=”https:\/\/eden-instruments.com\/wp-content\/uploads\/2024\/04\/ebac_acquisition_-_data_-_001.png” title_text=”ebac_acquisition_-_data_-_001″ _builder_version=”4.25.0″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_image][\/et_pb_column][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” custom_css_main_element=”margin: auto;” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” hover_enabled=”0″ header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

Find exact location of any open, resistive or shorting defect<\/h3>\n

[\/et_pb_text][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” hover_enabled=”0″ locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

    \n
  • Localize metal line cuts caused by cracking, corrosion, electro-migration, or foreign particles.<\/li>\n
  • Identify resistive opens caused by interface contamination at via interconnects.<\/li>\n
  • Pinpoint location for direct TEM lamella FIB preparation.<\/li>\n<\/ul>\n

    [\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”3_5,2_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||80px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” hover_enabled=”0″ header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

    Characterize CMOS interconnects with highest resolution<\/h3>\n

    [\/et_pb_text][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” hover_enabled=”0″ locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

      \n
    • Reveal electrical integrity of nets with sub-micron lateral resolution and bridge from EFA to PFA<\/li>\n
    • Diagnose fabrication and long term issues, including contamination, metal patterning defects, resistive interconnectors, or electro-migration.<\/li>\n
    • Directly isolate defects to the exact layer and die location and improve time to product improvement actions.<\/li>\n<\/ul>\n

      [\/et_pb_text][\/et_pb_column][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” custom_css_main_element=”margin: auto;” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_image src=”https:\/\/eden-instruments.com\/wp-content\/uploads\/2024\/04\/ebac_acquisition_-_data_-_006-1.png” title_text=”ebac_acquisition_-_data_-_006-1″ _builder_version=”4.25.0″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_image][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”2_5,3_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||80px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_image src=”https:\/\/eden-instruments.com\/wp-content\/uploads\/2024\/04\/EBAC-RCI.png” title_text=”EBAC-RCI” _builder_version=”4.25.0″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_image][\/et_pb_column][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” custom_css_main_element=”margin: auto;” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” hover_enabled=”0″ header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

      Verify device operation modes with built- in biasing and live overlay.<\/h3>\n

      [\/et_pb_text][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” hover_enabled=”0″ locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

        \n
      • Image junctions and fields in delayered operating devices.<\/li>\n
      • Map electrical activity of solar cells under bias.<\/li>\n
      • Compare imaged behaviour with device modelling.<\/li>\n<\/ul>\n

        [\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”3_5,2_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||80px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” hover_enabled=”0″ header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

        Localize defects in thin dielectric layers<\/h3>\n

        [\/et_pb_text][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” hover_enabled=”0″ locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

          \n
        • Visualise and localise weaknesses in gate oxide (GOX) and capacitor oxide (COX) before breakdown.<\/li>\n
        • Pinpoint oxide shorts caused by ESD or EOS with sub-micron resolution.<\/li>\n
        • Preserve the original defect signature with power dissipation in the lower nW range during localization.<\/li>\n<\/ul>\n

          [\/et_pb_text][\/et_pb_column][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” custom_css_main_element=”margin: auto;” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_image src=”https:\/\/eden-instruments.com\/wp-content\/uploads\/2024\/04\/ebac_acquisition_-_data_-_002-1.png” title_text=”ebac_acquisition_-_data_-_002″ _builder_version=”4.25.0″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_image][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”2_5,3_5″ use_custom_gutter=”on” gutter_width=”4″ make_equal=”on” _builder_version=”4.25.0″ _module_preset=”default” width=”100%” max_width=”100%” custom_margin=”0px||80px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_column type=”2_5″ _builder_version=”4.24.3″ _module_preset=”default” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_image src=”https:\/\/eden-instruments.com\/wp-content\/uploads\/2024\/04\/ebac_acquisition_-_data_-_003.png” title_text=”ebac_acquisition_-_data_-_003″ _builder_version=”4.25.0″ _module_preset=”default” border_radii=”on|8px|8px|8px|8px” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_image][\/et_pb_column][et_pb_column type=”3_5″ _builder_version=”4.24.3″ _module_preset=”default” custom_css_main_element=”margin: auto;” global_colors_info=”{}” theme_builder_area=”post_content”][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” header_3_text_align=”left” header_3_line_height=”1.2em” max_width_tablet=”35rem” max_width_phone=”35rem” max_width_last_edited=”off|desktop” custom_margin=”0px||9px||false|false” hover_enabled=”0″ header_3_font_size_tablet=”32px” header_3_font_size_phone=”26px” header_3_font_size_last_edited=”on|phone” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

          Access failures invisible in voltage contrast<\/h3>\n

          [\/et_pb_text][et_pb_divider color=”#ee0d08″ divider_weight=”4px” _builder_version=”4.24.3″ _module_preset=”default” max_width=”100px” module_alignment=”left” max_height=”4px” custom_margin=”0px||34px||false|false” custom_padding=”0px||0px||false|false” locked=”off” global_colors_info=”{}” theme_builder_area=”post_content”][\/et_pb_divider][et_pb_text _builder_version=”4.25.1″ _module_preset=”default” hover_enabled=”0″ locked=”off” global_colors_info=”{}” theme_builder_area=”post_content” sticky_enabled=”0″]<\/p>\n

            \n
          • Find low resistances that allows charge tunnelling trough the interconnects.<\/li>\n
          • Investigate structures in contact with the silicon substrate.<\/li>\n
          • Characterize large metal structures.<\/li>\n<\/ul>\n

            [\/et_pb_text][\/et_pb_column][\/et_pb_row][\/et_pb_section]<\/p>\n","protected":false},"excerpt":{"rendered":"

            Find exact location of any open, resistive or shorting defect.Find exact location of any open, resistive or shorting defect Localize metal line cuts caused by cracking, corrosion, electro-migration, or foreign particles. Identify resistive opens caused by interface contamination at via interconnects. Pinpoint location for direct TEM lamella FIB preparation. Characterize CMOS interconnects with highest resolution […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":25982128,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"on","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"dipi_cpt_category":[],"class_list":["post-25982138","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982138","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/comments?post=25982138"}],"version-history":[{"count":2,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982138\/revisions"}],"predecessor-version":[{"id":25982140,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982138\/revisions\/25982140"}],"up":[{"embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/pages\/25982128"}],"wp:attachment":[{"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/media?parent=25982138"}],"wp:term":[{"taxonomy":"dipi_cpt_category","embeddable":true,"href":"https:\/\/eden-instruments.com\/en\/wp-json\/wp\/v2\/dipi_cpt_category?post=25982138"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}